Wafer Inspection System Fabrication, Services Automation Equipment ~ Chong Automation Sdn Bhd

Visit
Official Website

Chong Automation Sdn Bhd
29, Lintang Beringin 6, Diamond Valley Industrial Park, Jalan Permatang Damar Laut, 11960 Penang, Malaysia.

+604-6266227
+604-6118202

+604-6264226

sales@chongautomation.com

Wafer Inspection System

1 / 11

Features	High-resolution and high-precision X - Y table. Capable of handling 12″ wafer. High speed inspection. Micro defect inspection of up to 5 micron. Window platform with user-defined specification. Built-in calibration feature. Auto-generation of GR & R report. Library based uploading for different types of die.
Functions	Automated optical inspection of micro wafer defects. Automated defect classification. Optional storage of defect images for engineering analysis. Wafer map creation / updated of loaded wafer map. Optional inking capability for defect dies. Statistical descriptive analysis of defects. Die counting.

Please leave your enquiry here, we will reply as soon as possible.
Name*
Company Name
Product Interested
Quantity
Email*
Contact No.*
Messages*

© 2017 - 2025 Chong Automation Sdn Bhd 200401027665 (666173-D) Visitors: 413721

Powered by N.MY